2016-12-29 - Rick Merritt

2016 paves the way for future breakthroughs

With various issues still on the line, hopes raised in 2016 will carry over into the next year.

2016-12-21 - STMicroelectronics

Storing aerospace products the correct way

ST aerospace dice are packed in waffle packs inside a clean room (Class 100, ISO 5). Each bulk includes a…

2016-11-29 - Hubertus Grobbel

Smart SD cards simplify security for IIoT

Flash-memory expert Swissbit offers a simple but smart security solution for connected factories: SD cards for system identification.

2016-11-01 - James Nolan

IIoT: Standards needed for connectivity, security

Most early adopters believe little organisational change will be necessary to integrate IoT into their day-to-day operations. Are they right?

2016-09-14 - Bipin Patel, Manzil Shah

ASIC design faces verification ‘escapes’

Bugs are still missed in design validation, despite the presence of powerful HVLs, metrologies and good verification practices.

2016-07-08 - Neil Oliver

Peek into the future of wearable medical electronics

With the right power management, design and production controls and when used under the guidance and on the recommendation of…

2016-07-07 - Duane Benson

USB Type-C in Micro-B domain

USB 3.1 spec can be a bit intimidating when compared to the USB Micro-B connector and the FTDI USB 2.0…

2016-07-06 - Adam Carlson

Implementing precision control for RC submarine

There are various sensors and techniques for precisely controlling the depth of an RC submarine using a ballast tank.

2016-07-05 - Robert Taylor

Universal high-power AC inputs: Bane or boon?

Designing a power supply that works over the "universal input range" can be useful for certain applications that are taken…

2016-07-04 - Bill Curtis, Robert Cragie

Security mechanisms for smart homes

By taking advantage of proven security mechanisms and protocols, engineers can significantly enhance the security of connected devices in the…

2016-06-24 - Jeff Smoot

Reliability and MTBF: What do they really mean?

Terms such as reliability and mean time between failure are discussed with casual disregard to what is really meant. So…

2016-06-24 - Ron Neale

What makes ReRAM/RRAM similar to lightning

Let us consider the possibility that the filaments-in-waiting have another role to control and keep a constant current density in…