Pulse I-V Characterization of Non-Volatile Memory Technologies

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Pulse I-V Characterization of Non-Volatile Memory Technologies

This application note provides a brief history of non-volatile memory (NVM), an overview of the test parameters required for electrical characterization of NVM materials and devices, and a discussion of emerging test requirements.

It also provides an overview of the NVM projects, tests, and parameters for testing floating gate flash, phase-change cell, ferro-electric cell devices, and resistive memory.

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