Keithley_Keithley Pulse Solutions Brochure (English)

Upload time: 2010-01-11

[Brief]This guide is designed to help you identify Keithley products that include pulse sources that might suit your application's requirements.

Keithley_Fundamentals of Semiconductor C-V Measurements

Upload time: 2010-01-11

[Brief]C-V measurements provide a wealth of information about device and material characteristics. Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies can also be characterized with C-V measurements, including bipolar junction transistors (BJTs), JFETs, III-V compound devices, photovoltaic cells, MEMs devices, organic TFT displays, photodiodes, carbon nanotubes (CNTs), and many others.

Keithley_Standards Will Help Ensure Order in Nano-Enabled Industries

Upload time: 2010-01-11

[Brief]The first fruits of nano R&D are already being harvested as disciplines as diverse as materials, electronics, biotechnology, and computing rush to exploit nanotechnology’s potential. Many consumers have already become familiar with nano-derived products, such as improved types of cosmetics, fabrics, paints, plastics, or personal electronics.
Nanotechnology offers all-but-unlimited opportunities for those who can develop the next exotic material or electronic component that is cheaper, better, and faster than today’s CMOS devices. It also holds huge promise for those who will create the tools needed to produce these materials and devices. Despite the recession, corporate and government labs around the world continue to invest bil¬lions in nanoscience research. Unfortunately, unless the public and private sectors work in cooperation to develop standardized test methods and guidelines, the transition from the laboratory to the marketplace could create many of the same problems as the California gold rush did, particularly for the environment. However, with careful planning, we can have the appropriate terminology, test measurement methods, reporting, and environmental, safety, and health safeguards in place early enough to ward off serious consequences.

Keithley_Download Keithley free Wafer Level Reliability Testing Brochure (English)

Upload time: 2009-12-01

[Brief]This brochure includes:
What’s your old reliability tester missing? Find out with ACS WLR.
Need to get from “data” to “decision” sooner?
Thought you needed more flexibility than a single test solution could deliver?
How do ACS WLR systems stack up against the competition?
How to maximize the return on your WLR test system investment?

Keithley_Source-Measure Units Increase Productivity and Accuracy

Upload time: 2009-12-01

[Brief]Source-Measure Units (SMUs) are more than the next generation of power supplies; they are fast-response, read-back voltage and current sources with high accuracy measurement capabilities, all tightly integrated in a single enclosure. They are designed for circuit and device evaluation where a DC signal must be applied to a device under test (DUT) and the response to that signal measured. Many are capable of 4-quadrant operation, acting as a positive or negative DC source or as a sink (load). They also provide highly repeatable measurements, typically with 61/2-digit resolution.

Keithley_Pulsed Characterization of Charge-trapping Behavior in High-k Gate Dielectrics

Upload time: 2009-12-01

[Brief]This article discusses the nature of the charge trapping and the limitation of DC characterization techniques in quantifying trapped charge. Then, it describes an ultra-fast pulse I-V technique for characterizing the intrinsic (“trap free”) performance of high-k gate transistors that exhibit the fast transient charging effect (FTCE).