Roll-to-roll processing with advanced laser drilling capabilities have realised economies of scale for flex-circuit suppliers, allowing wider use in s...
Automated optical inspection and direct imaging are ensuring higher yields for flexible circuit makers.
The R&S RT-ZM probe offers 9GHz bandwidth, DC offset range of ±16V and MultiMode function to switch between test modes without recontacting.
NASA has come up with a real-time, ultrasound-based device that sends an acoustic wave through the crimp assembly as it is being made.
The ASML NXE:3400B EUV lithography scanner runs at 148W to produce 104 wafers/h, capable of creating overlays within a 3nm tolerance.
Co-optimisation tools are now becoming mainstream to help translate between different worlds of chip designers and lithographers.
Inspections of up to 14nm mask defects or a detector supporting 2,000Hz frame rate are just two uphill tests to be at par with EUV wavelength.
The Harman Quick Predict is an end-to-end warning solution for industrial Internet of Things based on vibration analytical algorithm.
The Xcelium Parallel Simulator speeds runtime by an average of 3X for register-transfer level design simulation.
ZTE achieves a record–beyond a thousand images per second in facial recognition–known as “theoretical high accuracy” for its custom topology.