Home | Login | Register Now   [Nov 21,2009]
Global Sources
EE Times-Asia
For Registered Users Home / For Registered Users

Test suite supports SuperSpeed USB
Author: Ismini Scouras

From LeCroy Corp. comes a single-source lineup of test instruments to comprehensively support the USB 3.0 standard, also known as SuperSpeed USB.

Please login or register with us to view this article>>


If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

Talkback

eeForum:
Demystifying Vietnam

What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

more

 
Top tech resources
 
India Newsletter
 
Go to top