U.S. patent examiners against patent reform proposal
Author: K.C. Jones

A group representing patent examiners and professionals in the United States said that the patent reform proposal now in the U.S. Congress would hurt the American patent approval process.

Please login or register with us to view this article>>

Not yet registered?

Quick Register now and be part of the EE Times Asia community!

Email address:
Password:
Confirm password:
Company name:
Job function:
Products/Services:
Country/Area:

Click hereto fill out other information details. You can also subscribe to eeNews and apply to receive a copy of the magazine.

Registered already? Login to view complete content.

Email address:
Password:
	Password is case-sensitive.
	Remember password Forgot your password?

	If you have already registered on the following websites, please log in using your email address and password
EE Times-Asia sites: EE Times-India EE Times-Taiwan EE Times-Korea EE Times-China Analog/Mix signal Power Systems Embedded Design India Power Design India Home Entertainment Handheld Device Industrial Controls Auto Electronics

If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

	Latest News
Cisco's digital camcorder carries clean design (2009-07-06) DC/DC converters tout extra wide-input range (2009-07-06) Quad transceivers claims lowest jitter (2009-07-06) 512Kbit serial EEPROMs come in tiny packs (2009-07-06) DSA takes high-accuracy vibration measurement (2009-07-06) DSP kits ease portable medical apps dev't (2009-07-06) Zigbee standard addresses energy harvesting apps (2009-07-06) Wells Fargo, SunPower dip $100M in solar power (2009-07-06)

Talkback

eeForum:
Demystifying Vietnam
What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

Top tech resources

1.Web server design using soft processor(1,287views)

2. Address challenges in DVB-H (1,254views)

3. Using GMR sensors with scan interface (974views)

4. Simple glass breakage detector (970views)

5. Serial flash boot loader (883views)

India Newsletter

1.Automating disease detection

2.RPM to transform healthcare landscape

3.Taking next-gen cellular to rural India

4.Boost interoperability in SDR components

eMedia Asia	EE Times - India\|Embedded Design India\|Power Design - India\|\|\|
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center
TechInsights	EE Times\|ESM Online\|EE Times JAPAN

Copyright © 2009 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd.
is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement
and acceptance of our Terms of Use.