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Identify electrically overstressed LEDs (Part 3)

Posted: 02 Jun 2014     Print Version  Bookmark and Share

Keywords:LEDs  electrical overstress  EOS  Structure 2  Structure 3 

[Summary of tips] Read Part 1 here and Part 2 here.The LEDs tested demonstrated a wide range of EOS threshold failure levels depending on the LED chip structure, number of LED chips and device package construction. In general, single-chip high-power LEDs with multiple contact vias are most robust against EOS events. Low-power plastic packages ar......
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