Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Memory/Storage

Assessing correlated electron memory claims by 4DS

Posted: 14 May 2014     Print Version  Bookmark and Share

Keywords:ReRAM  4DS Inc.  metal oxide hetro-junction operation  MOHJO  non-volatile memory 

[Summary of tips] At a recent meeting of the American Vacuum Society, ReRAM developer 4DS Inc. gave an update on the progress it has made with the development of metal oxide hetro-junction operation (MOHJO) non-volatile memory. In that presentation, company representatives showed a micrograph of a 16k-bit crosspoint matrix. The joint development......
Please login or register with us to view this article>>
1 • 2 • 3 Next Page Last Page

Article Comments - Assessing correlated electron memory...
*  You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top