Memory/Storage 
Memory test tip: Alternative NVM options (Part 1)
Keywords:phase-change memory FRAM non-volatile memory
[Summary of tips] Traditionally, engineers have characterized floating-gate NAND flash memory with DC instruments such as source-measurement units (SMUs) after pulse generators had programmed and/or erased the memory cell. This approach requires some type of switch to apply the DC or pulse signal alternately to the device under test (DUT). Occas......Please login or register with us to view this article>>
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