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EDA/IP  

Addressing IC reliability issues (Part 1)

Posted: 26 Feb 2010  Print Version  Bookmark and Share Subscribe

Keywords: IC reliability  CMOS processes  IC industrial issues 

[Summary of tips] Advanced short-geometry CMOS processes are subject to aging that causes major reliability issues, degrading the performance of ICs over time. Two of the most problematic effects causing aging are hot carrier injection (HCI) and negative bias temperature instability (NBTI). Below 90nm, consideration of the effects of HCI and NBT......
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