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IEEE releases 1149.7 on-chip test standard
Keywords: on-chip test IEEE 1149.7 standard interface
[Summary of tips] IEEE has released the IEEE 1149.7 test and debug standard, which expands the 1149.1 JTAG standard's functionality while maintaining previously made industry investments.The standard, which was ratified in December 2009, was espoused by Texas Instruments, which was instrumental in working out the original 1149.1 standard."IEEE 1......Please login or register with us to view this article>>
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