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EDA/IP  

Targeting small delay defects

Posted: 13 Jan 2010  Print Version  Bookmark and Share Subscribe

Keywords: delay defect  quality of test  ATPG delay defects 

[Summary of tips] In the nanometer technology era, as the designs going further below 65nm, maintaining quality of test is a big concern in the test community. Test engineers are facing new test challenges at lower geometries and the small delay defects are one of them, which pose a serious concern for maintaining good DPM levels.The lower techn......
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