Manufacturing/Packaging 
Peridynamic equations spot chip flaws during design
Keywords: peridynamic equations chip flaw detection interface
[Summary of tips] A new method that harnesses an electronics failure simulation technique, called peridynamic equations, claims to enable engineers to detect design flaws resulting in cracks, fractures and interface faults before chip fabrication. Instead of the traditional differential equations and finite element methods used to model semicond......Please login or register with us to view this article>>
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