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Yield tool minimizes design re-spin

Posted: 20 Mar 2009  Print Version  Bookmark and Share Subscribe

Keywords: management tool yield  re spin  design test 

[Summary of tips] At the IEEE International Symposium on Quality Electronic Design (ISQED) conference, Synopsys Inc. introduced Yield Explorer, a new yield management tool that expedites the discovery and mitigation of yield limiters in leading-edge ICs.Yield Explorer minimizes design re-spin through rapid and comprehensive capture of design-pro......
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