Memory/Storage 
On-chip IP set to replace ATEs
Keywords: memory self test AMBIST chip IP on-chip ATE testing
[Summary of tips] Cost of testing a chip varies between different products, but it is often a major portion of the production cost nonetheless. Most chips rely heavily on ATE for testing, the cost of which depends on the amount of time needed for a particular chip. ATE driven tests are also constrained by performance of the ATE and natural limit......Please login or register with us to view this article>>
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