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Memory/Storage  

ZIF probe tips handle DDR, GDDR validation

Posted: 15 Jan 2009  Print Version  Bookmark and Share Subscribe

Keywords: probe tip  ZIF long wire  memory validation  DDR 

[Summary of tips] Agilent Technologies Inc. and Hynix Semiconductor Inc. have developed a high-bandwidth, high-performance long-wire zero insertion force (ZIF) probe tip optimized for DDR and GDDR SDRAM validation.The long-wire ZIF tip allows engineers to make accurate measurements of high-speed signals when they probe signals located farther ap......
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