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Vistec inspection system touts 30% increase in utilization
Keywords: inspection system system utilization macro inspection
[Summary of tips] Vistec Semiconductor Systems has added a new option called "Parallel Control Job" for its macro inspection product line LDS3300 that increases the system utilization by up to 30 percent.Systems combining multiple inspection tasks in one tool such as front side-, backside- and edge inspection traditionally can run only one wafer......Please login or register with us to view this article>>
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