T&M 
Parametric probe cards cut testing costs at 45nm, beyond
Keywords: parametric probe cards 45nm testing costs
[Summary of tips] Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond. These probe cards leverage Cascade Microtech's new Pyramid Plus parametric probe card manufacturing......Please login or register with us to view this article>>
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