Manufacturing/Packaging 
Parametric probe cards reduce cost of tests at 45nm
Keywords: probe card 45nm CMOS
[Summary of tips] Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for semiconductors with advanced processes nodes at 65nm, 45nm and beyond.The probe cards leverage Cascade's new Pyramid Plus parametric probe car......Please login or register with us to view this article>>
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