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Keithley updates ACS test software

Posted: 16 Jan 2008  Print Version  Bookmark and Share Subscribe

Keywords: semiconductor test and characterization software  integrated test systems  multi-site parallel test  wafer level plotting  die sorting 

[Summary of tips] Keithley Instruments Inc. has updated its software for semiconductor test and characterization at the device, wafer and cassette level. Automated Characterization Suite (ACS) V3.2 enhances the powerful automation capabilities of ACS integrated test systems by adding more powerful multisite parallel test capabilities, results bi......
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