T&M 
Perform low-power manufacturing test
Keywords: design-for-test process DFT process scan ATPG algorithms low-power manufacturing tests dynamic power consumption
[Summary of tips] The very process of testing digital circuits routinely increases their dynamic power consumption to levels exceeding their power specification. If the power consumption is great enough, it can result in failures at wafer probe or pre-burn-in package test that require a significant amount of time and effort to debug. This issue,......Please login or register with us to view this article>>
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