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Wafer probe stations cut cost in 45nm node

Posted: 14 Jan 2008  Print Version  Bookmark and Share Subscribe

Keywords: wafer probe station  45nm  wafer measurement 

[Summary of tips] Cascade Microtech has launched the next step in 300mm wafer probe stations designed to meet the need for advanced on-wafer measurements for semiconductor devices.The Elite 300 solves the critical measurement challenges at each advancing technology node by incorporating electrical and mechanical technology, advanced materials an......
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