T&M 
Test system targets multiple memory MCP devices
Keywords: memory test system tester-per-site architecture multichip packages
[Summary of tips] A high-speed, high-throughput memory test system for multichip packages (MCPs) has been introduced by Advantest Corp. The T5781 test system offers test speeds of 533Mbit/s for next-generation MCP devices that combine multiple memory types, including NAND, NOR and DRAM, in a single package.Complementing the T5781 is the T5781 En......Please login or register with us to view this article>>
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