T&M 
Instrument steps up C-V testing
Keywords: CV testing capacitance voltage measurements semiconductor system
[Summary of tips] Keithley Instruments Inc. introduces a capacitance-voltage (C-V) measurement instrument for its Model 4200-SCS Semiconductor Characterization System.The Model 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS. This allows fast and easy capacitance measurements from femtoFa......Please login or register with us to view this article>>
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