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Mentor upgrades TestKompress for 65/45nm nodes

Posted: 08 Oct 2007  Print Version  Bookmark and Share Subscribe

Keywords: Mentor TestKompress  45nm process  65nm technology node 

[Summary of tips] Mentor Graphics Corp. has announced new technology in its TestKompress ATPG product to address the industry's increasing demand for scan test compression. By providing compression levels exceeding 100X, the new Xpress technology allows IC manufacturers to meet challenging quality objectives for advanced process nodes at 65nm an......
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