Embedded 
Next-gen embedded designs demand parallel test
Keywords: parallel test embedded system design integrated system design platforms multicore
[Summary of tips] Truchard: Today's embedded devices are more functionally rich than the designs of the past.The embedded device industry is facing an interesting quandary: Systems are more complex while time constraints are tighter, and quality expectations are higher. Today's embedded devices are more functionally rich than the designs of the ......Please login or register with us to view this article>>
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