T&M 
Create high-quality program for at-speed test
Keywords: at-speed test do's and don'ts high-quality program at-speed test pattern
[Summary of tips] At-speed testing has been improved by a number of new capabilities, including the use of on-chip-generated functional clocks during test mode.Many of today's designs operate at very high frequencies and contain a number of clocks. On-chip PLLs are a common way to create internal clocks. Often, multipliers, dividers and other cl......Please login or register with us to view this article>>
|
Not yet registered?
 Register FREE to view unlimited features, tutorials and products, and enable any content alert service! |
Registered already? Login to view complete content.
|
Article Comments - Create high-quality program for at-s...
Visitor0213
(To avoid code verification, simply login or register with us. It is fast and free!)
Top Ranked Articles
Christmas Wishlist
All I want for Christmas is any of this year's Best of Innovations Design and Engineering Award honorees! Here's the EE Times pick for Top 10 CE gadgets.
Search EE Times Asia
Peek at Hot Gadgets for 2012
