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On-wafer solution brings power devices to market faster

Posted: 29 May 2007  Print Version  Bookmark and Share Subscribe

Keywords: power IC device  on-wafer characterization  high-current probe  high-voltage probe  IGBT 

[Summary of tips] In an effort to help power device manufacturers shorten time-to-market and overcome on-wafer probing challenges, Cascade Microtech Inc. announces its Tesla power IC device characterization system.Addressing the need for engineers and test technicians to safely characterize power IC devices, the Tesla system touts a complete on-......
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