Memory/Storage 
Self-test memory system increases chip yield rate
Keywords: self-test memory system increase chip yield embedded memory test
[Summary of tips] Faraday Technology Corp. has launched its repairable memory development system, REMEDE. The fully integrated embedded memory system, which is comprised of built-in-self-repair (BISR) function and the fuse group (fuse compiler), is said to increase overall chip yield, reduce chip cost and enhance manufacturing test quality.Unlik......Please login or register with us to view this article>>
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