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Manage EM at the start of nm designs
Keywords: electromigration in nanometer design EM analysis in nanometer design tips for nanometer design
[Summary of tips] Long-term reliability issues, including failure mechanisms like electromigration (EM), have traditionally been managed under the domain of the foundry. But as reliability becomes more difficult to achieve in nanometer designs, designers can no longer just toss the issue over the wall. Work must be done in the design domain to m......Please login or register with us to view this article>>
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