EDA/IP 
Cooperation sparks hope for new IC test standard
Keywords: OCI effort standards effort IC test standard yield improvement yield management tools
[Summary of tips] Do we need a new standards effort that would let chipmakers use IC test data for yield improvement? Michael Campbell, VP of engineering at Qualcomm, would be a likely supporter."By having a better link from the design to the fab to test, we can improve our ability to optimize yields faster," Campbell said. Today, he noted, ther......Please login or register with us to view this article>>
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