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Electrical DFM promises gains in parametric yield

Posted: 16 Mar 2007  Print Version  Bookmark and Share Subscribe

Keywords: DFM technology  DFM techniques  parametric yield loss  equivalent scaling  manufacturing technology 

[Summary of tips] As the IC industry moves into the 45nm node and beyond, manufacturing technology faces ever-greater challenges of pitch, mobility, variability, leakage and reliability. Design techniques are under greater pressure to provide "equivalent scaling" to enable the IC road map to continue in a cost-effective way.Design technology pro......
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