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NEC develops technology for design, quality inspection

Posted: 02 Mar 2007  Print Version  Bookmark and Share Subscribe

Keywords: signal jitter  LSIs  internal operating margins  observe internal operating margins 

[Summary of tips] NEC Corp. and NEC Electronics said they were successful in developing a technology that introduces signal jitter into an LSI's internal clock to accurately observe the internal operating margins of an LSI. The technology has an on-chip clock jitter formation circuit. It also features new design and quality inspection schemes wh......
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