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Conquer loss, create high-yielding designs
Keywords: yield loss mechanisms lithographic sensitivity poor surface planarity and sensitivity to random particle defects design-for-yield techniques new approach to higher-yielding silicon
[Summary of tips] This article discusses the three most important yield-loss mechanisms in 65nm designs, and proposed methods for mitigating yield loss without severe impact on design schedules. Using tools that are both powerful and well-integrated, design and layout engineers can create high-yielding designs while meeting design specifications......Please login or register with us to view this article>>
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