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Test tool optimizes data for IC yield

Posted: 18 Dec 2006  Print Version  Bookmark and Share Subscribe

Keywords: LogicVision Inc.  Mentor Graphics  Yield Insight  BIST  Scanburst 

[Summary of tips] A lot of test data can be used in optimizing IC yields, but the information must be captured and analyzed to be useful. LogicVision Inc.'s Yield Insight product, rolled out at the International Test Conference in Santa Clara, California, is being offered as a solution.LogicVision, best known for its memory and logic BIST techno......
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