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OptimalTest promises better yields through test management

Posted: 29 Nov 2006  Print Version  Bookmark and Share Subscribe

Keywords: OptimalTest  IC yield  chip yield  IC design  chip design 

[Summary of tips] Israeli-based startup OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results. The company's OT-TMS product marries automatic test equipment data with business enterprise data to give users a full picture of how test data affects a company's chip yields.The......
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