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Clear Shape solution promises fast DFM hotspot detection

Posted: 28 Nov 2006  Print Version  Bookmark and Share Subscribe

Keywords: Clear Shape  InShape  design manufacturability checker  Litho Yield Sensitivity  DFM 

[Summary of tips] Clear Shape Technologies Inc. has announced InShape, said to be the first model-based full-chip Design Manufacturability Checker that predicts accurate silicon shapes, providing designers the ability to do fast, accurate DFM hotspot detection of catastrophic failures. InShape's critical variation information is also a required ......
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