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Cadence, Source III partner for improved test validation

Posted: 30 Oct 2006  Print Version  Bookmark and Share Subscribe

Keywords: Cadence  Source III  ATPG  Verilog  Encounter Test ATPG 

[Summary of tips] Cadence Design Systems Inc. and Source III Inc. are collaborating to enable improved test validation and faster test conversion for enhanced chip quality.The joint effort expands silicon design chain by including validation by Source III of test programs developed on the proprietary Cadence Encounter Test ATPG platform, as well......
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