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EE Times-Asia > EDA/IP

Startup enables IC variability characterization

Posted: 01 Jun 2006  Print Version  Bookmark and Share Subscribe 

Keywords:Richard Goering  EE Times  Stratosphere Solutions Inc.  design-for-manufacturing  design-for-yield 

[Summary of tips] Numerous design-for-manufacturing (DFM) startups are promising to help designers maximize yields and manage process variability, but it all starts with the ability of silicon fabs to provide statistical parametric characterization. Stratosphere Solutions Inc. recently stepped forward to address that issue with intellectual prop......
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