Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
 
EE Times-Asia > EDA/IP
 
 
EDA/IP  

Startup enables IC variability characterization

Posted: 01 Jun 2006     Print Version  Bookmark and Share

Keywords:Richard Goering  EE Times  Stratosphere Solutions Inc.  design-for-manufacturing  design-for-yield 

[Summary of tips] Numerous design-for-manufacturing (DFM) startups are promising to help designers maximize yields and manage process variability, but it all starts with the ability of silicon fabs to provide statistical parametric characterization. Stratosphere Solutions Inc. recently stepped forward to address that issue with intellectual prop......
Please login or register with us to view this article>>
 


Article Comments - Startup enables IC variability chara...
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 
 
Back to Top