EDA/IP 
Startup enables IC variability characterization
Keywords: Richard Goering EE Times Stratosphere Solutions Inc. design-for-manufacturing design-for-yield
[Summary of tips] Numerous design-for-manufacturing (DFM) startups are promising to help designers maximize yields and manage process variability, but it all starts with the ability of silicon fabs to provide statistical parametric characterization. Stratosphere Solutions Inc. recently stepped forward to address that issue with intellectual prop......Please login or register with us to view this article>>
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