Global Sources
EE Times-Asia
 Catch the latest   Vital Signs     Tech Watch     In Asia
EE Times-Asia > T&M
 
 
T&M  

IC testing pushes zero defects in autos

Posted: 01 Mar 2006  Print Version  Bookmark and Share Subscribe

Keywords: scott bibbee  pintail technologies  defect per million  part average testing  six sigma 

[Summary of tips] The industry buzz on zero-defect initiatives is growing and IC manufacturers are taking the challenge to satisfy automotive customers.View the PDF document for more information.
 
 

Article Comments - IC testing pushes zero defects in au...
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
Christmas Wishlist
Peek at Hot Gadgets for 2012
Smart energy "Try explaining to your eight-year-old son that instead of an Xbox, you got him a Wi-Fi enabled smart energy thermostat to help minimize his energy consumption and carbon footprint..."