Manufacturing/Packaging 
Metrology tool handles high volume production of 300mm wafers
Keywords: nanotechnology metrology tool Metryx Mentor DF3
[Summary of tips] A new, non-destructive, nanotechnology weight metrology tool has been introduced by Metryx to handle high volume production of 300mm semiconductor wafers. According to the press release, the Mentor DF3 has been designed to easily adapt to handling a mixed wafer fab environment where 200mm and 300mm wafers are continually interc......Please login or register with us to view this article>>
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