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KLA touts technology to cut flash defect detection time

Posted: 22 Nov 2005  Print Version  Bookmark and Share Subscribe

Keywords: kla  flash defect  detection  microloop 

[Summary of tips] KLA-Tencor Corp. said that it has identified a new application for its MicroLoop electrical defect detection methodology that can detect critical bridging defects on advanced flash memory wafers nearly twice as fast as current methods.KLA (San Jose, Calif.) said the new application was developed through collaboration with Spans......
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