T&M 
Indian researchers propose new SoC test method
Keywords: soc design test community
[Summary of tips] BROKEN_TABLE_ HIDDEN_END -->With efficient test access architecture of much interest to the SoC design and test community, two researchers at an Indian technical institute have proposed a design-for-test method for digital SoC designs using a Test Access Mechanism (TAM) switch.Shibaji Banerjee and Dipanwita Roy Chowdhury of th......Please login or register with us to view this article>>
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