Optoelectronics/Displays 
Sub-angstrom microscope targets nanotechnology
Keywords: microscopy atomic scale imaging nanotechnology
[Summary of tips] BROKEN_TABLE_ HIDDEN_END -->FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time. Designed for nanotechnology development, FEI's microscope, called the Titan 80-300, enables sub-angstrom (at......Please login or register with us to view this article>>
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