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Agilent proposes test solution for MCPs

Posted: 15 Jul 2005  Print Version  Bookmark and Share Subscribe

Keywords: memory test system  multichip packages 

[Summary of tips] BROKEN_TABLE_ HIDDEN_END -->Agilent Technologies unveiled its approach to production memory test systems at the Semicon West show.Aimed at the problems posed by the skyrocketing use of multichip packages (MCPs), Agilent's system promises single-insertion, highly parallel full-speed testing of packaged MCPs.Gayn Erickson, Agile......
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