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Manufacturing/Packaging  

Leica's new system eases manual inspection of 300mm wafers

Posted: 20 Apr 2005  Print Version  Bookmark and Share Subscribe

Keywords: leica  ins300  leica Microsystems 

[Summary of tips] BROKEN_TABLE_ HIDDEN_END --> BROKEN_PICTURE_ HIDDEN_END -->Leica Microsystems disclosed that its new Leica INS300 fits the demands of IC manufacturers for equipment with optimized price and performance ratio. According to the company, they were able to implement the customers' wishes in the new system which has a development p......
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