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Semiconductor analyzer packs integrated CV, IV capability

Posted: 08 Apr 2005  Print Version  Bookmark and Share Subscribe

Keywords: keithley instruments  wafer tester  agilent technologies  device analyzer  cv 

[Summary of tips] On the heels of the announcement by Keithley Instruments of its third-generation wafer tester, test-and-measurement giant Agilent Technologies is introducing a Windows-based semiconductor device analyzer that integrates CV (capacitance versus voltage) and iv (current versus voltage) measurements into a single instrument.This si......
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