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Bit-error-rate testing the DS314x series of DS3/E3 framers

Posted: 21 Jun 2004  Print Version  Bookmark and Share Subscribe

Keywords: DS2174  clock 

[Summary of tips] This app note demonstrates how to use pattern generation, synchronization, and bit test features of the DS2174 enhanced BERT with the single and multiport versions of the DS314x series of DS3/E3 framers.View the PDF document for more information.
 
 

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