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Manufacturing/Packaging  

Keithley device tests 300mm wafers in 200mm test times

Posted: 10 Dec 2003  Print Version  Bookmark and Share Subscribe

Keywords: keithley instruments  s600 series  s680dc/rf parametric test system  simultest 

[Summary of tips] Keithley Instruments Inc. has expanded its S600 series with the release of the S680DC/RF parametric test system that allows control of 300mm wafer processes in 200mm test times. The optional SimulTest parallel test software measures up to nine devices simultaneously within a single probe touchdown.The improved source-measure un......
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